Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Comprehensive failure analysis of leakage faults in bipolar transistors., , , , and . Microelectron. Reliab., 42 (9-11): 1449-1452 (2002)Determination of temperature change inside IC packages during laser ablation of molding compound., , , and . Microelectron. Reliab., 48 (8-9): 1263-1267 (2008)Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation., , , , , , and . Microelectron. Reliab., 41 (9-10): 1539-1544 (2001)Fast reliability qualification of SiP products., , , , , and . Microelectron. Reliab., 49 (9-11): 958-962 (2009)Dynamic study of the thermal laser stimulation response on advanced technology structures., , , , , and . Microelectron. Reliab., 48 (10): 1689-1695 (2008)Fast and rigorous use of thermal time constant to characterize back end of the line test structure in advanced technology., , , , and . Microelectron. Reliab., 48 (8-9): 1279-1284 (2008)Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems., , , , , , and . Microelectron. Reliab., 44 (9-11): 1559-1563 (2004)Isolating failing sites in IC packages using time domain reflectometry: Case studies., , , and . Microelectron. Reliab., 45 (9-11): 1639-1644 (2005)