( en | de | ru )

 

Disambiguation of "Katoh, Kentaroh"

Author of the publication

copydeleteadd this publication to your clipboard
Analog/mixed-signal circuit design in nano CMOS era.

, , , and . IEICE Electron. Express, 11 (3): 20142001 (2014)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Eishow Katoh

Eishow Katoh

Marcus Katoh

Eishow Katoh

 

Other publications of authors with the same name

Design for Delay Fault Testability of Dual Circuits Using Master and Slave Scan Paths., , and . IEICE Trans. Inf. Syst., 92-D (3): 433-442 (2009)Design for Delay Fault Testability of 2-Rail Logic Circuits., , and . IEICE Trans. Inf. Syst., 92-D (2): 336-341 (2009)An Analysis of Stochastic Self-Calibration of TDC Using Two Ring Oscillators., , , , , and . Asian Test Symposium, page 140-146. IEEE Computer Society, (2013)A Delay Measurement Technique Using Signature Registers., , , , and . Asian Test Symposium, page 157-162. IEEE Computer Society, (2009)An On-Chip Delay Measurement Technique Using Signature Registers for Small-Delay Defect Detection., , and . IEEE Trans. Very Large Scale Integr. Syst., 20 (5): 804-817 (2012)Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies., , , , , , , , , and 2 other author(s). J. Electron. Test., 38 (1): 21-38 (2022)Design of On-Line Testing for SoC with IEEE P1500 Compliant Cores Using Reconfigurable Hardware and Scan Shift., , and . IOLTS, page 203-204. IEEE Computer Society, (2005)Innovative Practices Track: Innovative Analog Circuit Testing Technologies., , , , , , , , , and 8 other author(s). VTS, page 1. IEEE, (2022)Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable Devices., and . ETS, page 69-74. IEEE Computer Society, (2006)A Small Chip Area Stochastic Calibration for TDC Using Ring Oscillator., , , , , , and . J. Electron. Test., 30 (6): 653-663 (2014)