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Accurate Extraction of the Trap Depth from RTS Noise Data by Including Poly Depletion Effect and Surface Potential Variation in MOSFETs.

, , , и . IEICE Trans. Electron., 90-C (5): 968-972 (2007)

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Dong-Shin Shin

Jeonghun Shin

Kirche als Weltforum: zum Dialogverständnis in kirchlichen Dokumenten seit dem Zweiten Vatikanischen Konzil. Uni München, (2009)

Hyeseon Shin

Hwa-Ja Shin

Jung-Hyu Shin

 

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