Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

BASTION: Board and SoC test instrumentation for ageing and no failure found., , , , , , , , and . DATE, page 115-120. IEEE, (2017)Software-Based Self-Test for Transition Faults: a Case Study., , , and . VLSI-SoC, page 76-81. IEEE, (2019)A Novel Sequence Generation Approach to Diagnose Faults in Reconfigurable Scan Networks., , , and . IEEE Trans. Computers, 69 (1): 87-98 (2020)Test-Plan Optimization for Flying-Probes In-Circuit Testers., , , and . ITC-Asia, page 19-24. IEEE, (2019)New techniques for efficiently assessing reliability of SOCs., , , , and . Microelectron. J., 34 (1): 53-61 (2003)On the Automatic Generation of Optimized Software-Based Self-Test Programs for VLIW Processors., , and . IEEE Trans. Very Large Scale Integr. Syst., 22 (4): 813-823 (2014)RT-Level ITC'99 Benchmarks and First ATPG Results., , and . IEEE Des. Test Comput., 17 (3): 44-53 (2000)New Techniques to Reduce the Execution Time of Functional Test Programs., , , and . IEEE Trans. Computers, 66 (7): 1268-1273 (2017)Fault Grading Techniques of Software Test Libraries for Safety-Critical Applications., , and . IEEE Access, (2019)The Use of Model Checking in ATPG for Sequential Circuits., , , and . CAV, volume 531 of Lecture Notes in Computer Science, page 86-95. Springer, (1990)