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A study on substrate noise coupling among TSVs in 3D chip stack., , , , и . IEICE Electron. Express, 15 (13): 20180460 (2018)Design of Test Modules for the Analysis of MCM Interconnects., , и . ED&TC, стр. 614. IEEE Computer Society, (1996)Design issues in heterogeneous 3D/2.5D integration., , , , , и . ASP-DAC, стр. 403-410. IEEE, (2013)A novel concept for ultra-low capacitance via-last TSV., , , , , и . 3DIC, стр. 1-4. IEEE, (2010)In-tier diagnosis of power domains in 3D TSV ICs., , , , , , , , , и 1 other автор(ы). 3DIC, стр. 1-6. IEEE, (2011)Impact of 3D design choices on manufacturing cost., , , , и . 3DIC, стр. 1-5. IEEE, (2009)Active-lite interposer for 2.5 & 3D integration., , , , , , , , , и 5 other автор(ы). VLSIC, стр. 222-. IEEE, (2015)Constant Impedance Scaling Paradigm for Scaling LC transmission lines., , , , , , и . ISQED, стр. 387-392. IEEE Computer Society, (2006)Thermal experimental and modeling analysis of high power 3D packages., , , , , и . ICICDT, стр. 1-4. IEEE, (2015)Design Issues and Considerations for Low-Cost 3-D TSV IC Technology., , , , , , , , , и 27 other автор(ы). IEEE J. Solid State Circuits, 46 (1): 293-307 (2011)