Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Misalignment Analysis and Electrical Performance of High Density 3D-IC interconnects., , , , and . 3DIC, page 1-4. IEEE, (2019)Reliability of TSV interconnects: Electromigration, thermal cycling, and impact on above metal level dielectric., , , , , , , , , and . Microelectron. Reliab., 53 (1): 17-29 (2013)2.3 A 220GOPS 96-Core Processor with 6 Chiplets 3D-Stacked on an Active Interposer Offering 0.6ns/mm Latency, 3Tb/s/mm2 Inter-Chiplet Interconnects and 156mW/mm2@ 82%-Peak-Efficiency DC-DC Converters., , , , , , , , , and 18 other author(s). ISSCC, page 46-48. IEEE, (2020)Towards high density 3D interconnections., , , , , and . 3DIC, page 1-2. IEEE, (2016)IntAct: A 96-Core Processor With Six Chiplets 3D-Stacked on an Active Interposer With Distributed Interconnects and Integrated Power Management., , , , , , , , , and 18 other author(s). IEEE J. Solid State Circuits, 56 (1): 79-97 (2021)Fine pitch 3D interconnections with hybrid bonding technology: From process robustness to reliability., , , , , , , , , and 7 other author(s). IRPS, page 4. IEEE, (2018)Study of EM void nucleation and mechanic relaxation effects., , and . Microelectron. Reliab., 54 (9-10): 1692-1696 (2014)3D interconnection using copper direct hybrid bonding for GaN on silicon wafer., , , , , , , and . 3DIC, page 1-4. IEEE, (2021)Interconnect design study for electromigration reliability improvement., , , and . IRPS, page 2. IEEE, (2015)Apocalypse Dog., , , , , , , and . SIGGRAPH Asia Computer Animation Festival, page 9:1. ACM, (2022)