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Software-Based Self-Test for Transition Faults: a Case Study., , , and . VLSI-SoC, page 76-81. IEEE, (2019)Test-Plan Optimization for Flying-Probes In-Circuit Testers., , , and . ITC-Asia, page 19-24. IEEE, (2019)System-level test bench generation in a co-design framework., , , , and . ETW, page 25-30. IEEE Computer Society, (2000)BASTION: Board and SoC test instrumentation for ageing and no failure found., , , , , , , , and . DATE, page 115-120. IEEE, (2017)Exploring the Mysteries of System-Level Test., , , , , , , , , and . ATS, page 1-6. IEEE, (2020)Effective SAT-based Solutions for Generating Functional Sequences Maximizing the Sustained Switching Activity in a Pipelined Processor., , , , , and . ATS, page 73-78. IEEE, (2021)Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing., , , , , and . ETS, page 1-5. IEEE, (2023)Exploiting the Selfish Gene algorithm for evolving hardware cellular automata., , and . CEC, page 1401-1406. IEEE, (2000)Simulation-Based Analysis of SEU Effects on SRAM-based FPGAs., , and . FPL, volume 2438 of Lecture Notes in Computer Science, page 607-615. Springer, (2002)A Software Fault Tolerance Method for Safety-Critical Systems: Effectiveness and Drawbacks., , , , and . SBCCI, page 101-108. IEEE Computer Society, (2002)