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A Defect-Tolerant Reusable Network of DACs for Wafer-Scale Integration.

, , , , и . IEEE Trans. Very Large Scale Integr. Syst., 27 (2): 304-315 (2019)

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Yves Robert

Yves Matthess

Yves Steinmetz

Yves Hoffmann

Yves Gensterblum

 

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