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Disambiguation of "Asian, Manuel J. Barragan"

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OBT for settling error test of sampled-data systems using signal-dependent clocking.

, , and . ETS, page 1-6. IEEE Computer Society, (2012)

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Manuel J A Eugster

Manuel J A Eugster

Manuel J A Eugster

Hugo Bernal Barragán

Manuel

 

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Sine-Wave Signal Characterization Using Square-Wave and SigmaDelta-Modulation: Application to Mixed-Signal BIST., , , , , , and . J. Electron. Test., 21 (3): 221-232 (2005)Digital Adaptive Calibration of Multi-Step Analog to Digital Converters., , and . J. Low Power Electron., 8 (2): 182-196 (2012)On-chip biased voltage-controlled oscillator with temperature compensation of the oscillation amplitude for robust I/Q generation., , , , and . ISCAS, page 1979-1982. IEEE, (2010)OBT for settling error test of sampled-data systems using signal-dependent clocking., , and . ETS, page 1-6. IEEE Computer Society, (2012)Low-Power Die-Level Process Variation and Temperature Monitors for Yield Analysis and Optimization in Deep-Submicron CMOS., , and . IEEE Trans. Instrumentation and Measurement, 61 (8): 2212-2221 (2012)A Procedure for Alternate Test Feature Design and Selection., and . IEEE Des. Test, 32 (1): 18-25 (2015)(Some) Open Problems to Incorporate BIST in Complex Heterogeneous Integrated Systems., , , and . DELTA, page 8-13. IEEE Computer Society, (2010)Multi-condition alternate test of analog, mixed-signal, and RF systems., , and . LATW, page 1-6. IEEE Computer Society, (2012)Low-cost signature test of RF blocks based on envelope response analysis., , , , and . European Test Symposium, page 55-60. IEEE Computer Society, (2010)A BIST Solution for Frequency Domain Characterization of Analog Circuits., , and . J. Electron. Test., 26 (4): 429-441 (2010)