( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage.

, , , и . J. Electron. Test., 18 (2): 179-187 (2002)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

Isabel C Kelly

Renata Teixeira

José Teixeira

Andreas Teixeira

Jeane Teixeira

 

Другие публикации лиц с тем же именем

Investigating the Use of BICS to detect resistive-open defects in SRAMs., , , , , , и . IOLTS, стр. 200-201. IEEE Computer Society, (2010)RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage., , , и . J. Electron. Test., 18 (2): 179-187 (2002)On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level., , , , , и . J. Electron. Test., 20 (4): 345-355 (2004)Aging-Aware Power or Frequency Tuning With Predictive Fault Detection., , , , , , , , и . IEEE Des. Test Comput., 29 (5): 27-36 (2012)Automatic Configuration of a Medical Imaging System to Unknown Delays in Synchronous Input Data Channels., , , , , , , , и . ISCAS, стр. 1185-1188. IEEE, (2010)Process Tolerant Design Using Thermal and Power-Supply Tolerance in Pipeline Based Circuits., , , , , и . DDECS, стр. 34-37. IEEE Computer Society, (2008)Predictive error detection by on-line aging monitoring., , , , , , , и . IOLTS, стр. 9-14. IEEE Computer Society, (2010)MOSYS A Methodology for Automatic Object Identification from System Specification., , , , и . ISORC, стр. 198-201. IEEE Computer Society, (2000)Performance Sensor for Reliable Operation., , , , и . HCI (8), том 10908 из Lecture Notes in Computer Science, стр. 347-365. Springer, (2018)Time Management for Low-Power Design of Digital Systems., , , , , , и . J. Low Power Electron., 4 (3): 410-419 (2008)