Author of the publication

A Low Area On-chip Delay Measurement System Using Embedded Delay Measurement Circuit.

, , and . Asian Test Symposium, page 343-348. IEEE Computer Society, (2010)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

A Delay Measurement Technique Using Signature Registers., , , , and . Asian Test Symposium, page 157-162. IEEE Computer Society, (2009)An Analysis of Stochastic Self-Calibration of TDC Using Two Ring Oscillators., , , , , and . Asian Test Symposium, page 140-146. IEEE Computer Society, (2013)Design for Delay Fault Testability of 2-Rail Logic Circuits., , and . IEICE Trans. Inf. Syst., 92-D (2): 336-341 (2009)A Physically Unclonable Function Using Time-to-Digital Converter with Linearity Self-Calibration and its FPGA Implementation., , , , , , , , , and 3 other author(s). ITC-Asia, page 1-6. IEEE, (2023)Fault Tolerant SoC Architecture Design for JPEG2000 Using Partial Reconfigurability., , and . DFT, page 31-40. IEEE Computer Society, (2007)Two-Stage Stuck-at Fault Test Data Compression Using Scan Flip-Flops with Delay Fault Testability., , and . Inf. Media Technol., 3 (4): 704-716 (2008)Innovative Practices Track: Innovative Analog Circuit Testing Technologies., , , , , , , , , and 8 other author(s). VTS, page 1. IEEE, (2022)Design of On-Line Testing for SoC with IEEE P1500 Compliant Cores Using Reconfigurable Hardware and Scan Shift., , and . IOLTS, page 203-204. IEEE Computer Society, (2005)Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable Devices., and . ETS, page 69-74. IEEE Computer Society, (2006)A low area calibration technique of TDC using variable clock generator for accurate on-line delay measurement., and . ISQED, page 430-434. IEEE, (2015)