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An oscillation-based test structure for timing information extraction., , , и . VTS, стр. 74-79. IEEE Computer Society, (2012)Big data and test.. ITC, стр. 1. IEEE Computer Society, (2014)Invited paper: Yin and Yang of embedded sensors for post-scaling-era.. VTS, стр. 324-327. IEEE Computer Society, (2011)5.5GHz system z microprocessor and multi-chip module., , , , , , , , , и 13 other автор(ы). ISSCC, стр. 46-47. IEEE, (2013)Data Analysis Techniques for CMOS Technology Characterization and Product Impact Assessment., , и . ITC, стр. 1-10. IEEE Computer Society, (2006)Video-Text Compliance: Activity Verification Based on Natural Language Instructions., , , , , , , , , и 3 other автор(ы). ICCV Workshops, стр. 1503-1512. IEEE, (2019)Using test data to improve IC quality and yield.. ICCAD, стр. 771-777. IEEE Computer Society, (2008)Guest Editor's Introduction: Getting More Out of Test.. IEEE Des. Test Comput., 24 (5): 474-475 (2007)The 12-Core POWER8™ Processor With 7.6 Tb/s IO Bandwidth, Integrated Voltage Regulation, and Resonant Clocking., , , , , , , , , и 20 other автор(ы). IEEE J. Solid State Circuits, 50 (1): 10-23 (2015)System-level impact of chip-level failure mechanisms and screens.. ICCAD, стр. 173-176. IEEE, (2010)