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MEMS fault model generation using CARAMEL.

, , и . ITC, стр. 557-566. IEEE Computer Society, (1998)

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Robin Blanton

Thomas R Blanton

Ronald Keipert

Acmella ciliata (H.B.K.) Cassini: phytochemische und enzymatische Untersuchungen, galenische Präformulierungen. FU Berlin, (2009)

D Böttger

D Zeppenfeld

 

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Modeling the Economics of Testing: A DFT Perspective., , , , и . IEEE Des. Test Comput., 19 (1): 29-41 (2002)Defect Modeling Using Fault Tuples., , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 25 (11): 2450-2464 (2006)Characterization of Locked Sequential Circuits via ATPG., , , и . ITC-Asia, стр. 97-102. IEEE, (2019)The input pattern fault model and its application., и . ED&TC, стр. 628. IEEE Computer Society, (1997)Improving the Accuracy of Test Compaction through Adaptive Test Update., и . ITC, стр. 1. IEEE Computer Society, (2008)Physically-Aware N-Detect Test Pattern Selection., , , и . DATE, стр. 634-639. ACM, (2008)Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling., , , , , и . ITC, стр. 1-10. IEEE Computer Society, (2014)Efficient built-in self test of regular logic characterization vehicles., и . VTS, стр. 1-6. IEEE Computer Society, (2015)Maintaining Accuracy of Test Compaction through Adaptive Re-learning., и . VTS, стр. 257-263. IEEE Computer Society, (2009)Synthesis of Self-Testing Finite State Machines from High-Level Specifications., , и . ITC, стр. 757-766. IEEE Computer Society, (1996)