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Disambiguation of "Vangal, Sriram R."

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Adaptive Frequency and Biasing Techniques for Tolerance to Dynamic Temperature-Voltage Variations and Aging.

, , , , , , , , , , , , , , , , , , and . ISSCC, page 292-604. IEEE, (2007)

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Sriram Rallabhandi

Sriram Varadarajan

Sriram Subramanian

Sriram Ayyaswamy

Sriram Srinivasan

 

Other publications of authors with the same name

Test implications and challenges in near threshold computing special session., , , and . VTS, page 1. IEEE Computer Society, (2016)A 90mW/GFlop 3.4GHz Reconfigurable Fused/Continuous Multiply-Accumulator for Floating-Point and Integer Operands in 65nm., , , , , , and . VLSI Design, page 252-257. IEEE Computer Society, (2010)Within-Die Variation-Aware Dynamic-Voltage-Frequency-Scaling With Optimal Core Allocation and Thread Hopping for the 80-Core TeraFLOPS Processor., , , , , , , , , and 2 other author(s). IEEE J. Solid State Circuits, 46 (1): 184-193 (2011)A 2 Tb/s 6 , ˟, 4 Mesh Network for a Single-Chip Cloud Computer With DVFS in 45 nm CMOS., , , , , , , , and . IEEE J. Solid State Circuits, 46 (4): 757-766 (2011)An 80-Tile 1.28TFLOPS Network-on-Chip in 65nm CMOS., , , , , , , , , and 4 other author(s). ISSCC, page 98-589. IEEE, (2007)An IA-32 processor with a wide voltage operating range in 32nm CMOS., , , , , , , , , and 9 other author(s). Hot Chips Symposium, page 1-37. IEEE, (2012)An energy harvesting wireless sensor node for IoT systems featuring a near-threshold voltage IA-32 microcontroller in 14nm tri-gate CMOS., , , , , , , , , and 2 other author(s). VLSI Circuits, page 1-2. IEEE, (2016)A Reconfigurable On-die Traffic Generator in 45nm CMOS for a 48 iA-32 Core Network-on-Chip., , , , , , , , and . VLSI Design, page 292-297. IEEE Computer Society, (2012)Within-die variation-aware dynamic-voltage-frequency scaling core mapping and thread hopping for an 80-core processor., , , , , , , , , and 2 other author(s). ISSCC, page 174-175. IEEE, (2010)The 48-core SCC Processor: the Programmer's View., , , , , , , , , and 1 other author(s). SC, page 1-11. IEEE, (2010)