( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
On the in-field functional testing of decode units in pipelined RISC processors.

, , , , , , , и . DFT, стр. 299-304. IEEE Computer Society, (2014)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

Alexander De Luca

Luca De Pascalis

Nina De Luca

Emanuela De Luca

Maria Teresa De Luca

 

Другие публикации лиц с тем же именем

apeNEXT: a Multi-TFlops Computer for Elementary Particle Physics., , , , , , , , , и 11 other автор(ы). PARCO, том 13 из Advances in Parallel Computing, стр. 355-362. Elsevier, (2003)Parallel software-based self-test suite for multi-core system-on-chip: Migration from single-core to multi-core automotive microcontrollers., , , , и . DTIS, стр. 1-6. IEEE, (2018)On-line software-based self-test for ECC of embedded RAM memories., , , и . DFT, стр. 1-6. IEEE Computer Society, (2017)Software-based self-test techniques of computational modules in dual issue embedded processors., , , , , , , и . ETS, стр. 1-2. IEEE, (2015)Deterministic Cache-based Execution of On-line Self-Test Routines in Multi-core Automotive System-on-Chips., , , , , , , и . DATE, стр. 1235-1240. IEEE, (2020)Software-Based Self-Test Techniques for Dual-Issue Embedded Processors., , , , , и . IEEE Trans. Emerg. Top. Comput., 8 (2): 464-477 (2020)Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions., , , , , , , , и . DATE, стр. 920-923. IEEE, (2019)On the in-field testing of spare modules in automotive microprocessors., , , , , и . VLSI-SoC, стр. 1-6. IEEE, (2017)In-field functional test programs development flow for embedded FPUs., , , , и . DFT, стр. 107-110. IEEE Computer Society, (2016)A Decentralized Scheduler for On-line Self-test Routines in Multi-core Automotive System-on-Chips., , , , , и . ITC, стр. 1-10. IEEE, (2019)