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On-Detector Electronics of the Clear PEM Scanner.

E. Albuquerque, V. Bexiga, R. Bugalho, B. Carriço, C. Ferreira, M. Ferreira, J. Godinho, F. Gonçalves, C. Leong, P. Lousã, P. Machado, R. Moura, P. Neves, C. Ortigão, F. Piedade, J. Pinheiro, P. Relvas, A. Rivetti, P. Rodrigues, J. Silva, M. Silva, I. Teixeira, J. Teixeira, A. Trindade, and J. Varela. BIODEVICES, page 355-358. INSTICC Press, (2009)

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Manuel Gonçalves

Marcio Gonçalves

Antonio Carlos Gonçalves

Marcelo Gonçalves

Marta Gonçalves

Other publications of authors with the same name

On the Analysis of Routing Cells and Adjacency Faults in CMOS Digital Circuits.A. Casimiro, F. Gonçalves, J. Teixeira, and M. Santos. DFT, page 263-270. IEEE Computer Society, (1994)RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage.M. Santos, F. Gonçalves, I. Teixeira, and J. Teixeira. J. Electron. Test., 18 (2): 179-187 (2002)Hardware/software specialization through aspects: The LARA approach.J. Cardoso, T. Carvalho, J. Teixeira, P. Diniz, F. Gonçalves, and Z. Petrov. ICSAMOS, page 260-267. IEEE, (2012)Fault Modeling and Defect Level Projections in Digital ICs.J. de Sousa, F. Gonçalves, J. Teixeira, and T. Williams. EDAC-ETC-EUROASIC, page 436-442. IEEE Computer Society, (1994)A Low-Cost Scalable Pipelined Reconfigurable Architecture for Simulation of Digital Circuits.V. Gonçalves, J. de Sousa, and F. Gonçalves. FPL, page 481-486. IEEE, (2005)RTL-Based Functional Test Generation for High Defects Coverage in Digital Systems.M. Santos, F. Gonçalves, I. Teixeira, and J. Teixeira. J. Electron. Test., 17 (3-4): 311-319 (2001)On-Detector Electronics of the Clear PEM Scanner.E. Albuquerque, V. Bexiga, R. Bugalho, B. Carriço, C. Ferreira, M. Ferreira, J. Godinho, F. Gonçalves, C. Leong, P. Lousã and 15 other author(s). BIODEVICES, page 355-358. INSTICC Press, (2009)Low Energy Heterogeneous Computing with Multiple RISC-V and CGRA Cores.L. Fiolhais, F. Gonçalves, R. Duarte, M. Véstias, and J. de Sousa. ISCAS, page 1-5. IEEE, (2019)Defect-oriented test quality assessment using fault sampling and simulation.F. Gonçalves, M. Santos, I. Teixeira, and J. Teixeira. ITC, page 35-42. IEEE Computer Society, (1998)Defect level evaluation in an IC design environment.J. de Sousa, F. Gonçalves, J. Teixeira, C. Marzocca, F. Corsi, and T. Williams. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 15 (10): 1286-1293 (1996)

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Disambiguation of "Gonçalves, Fernando M."

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On-Detector Electronics of the Clear PEM Scanner.

Please choose a person to relate this publication to

Manuel Gonçalves

Marcio Gonçalves

Antonio Carlos Gonçalves

Marcelo Gonçalves

Marta Gonçalves

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Gonçalves, Fernando M."

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML On-Detector Electronics of the Clear PEM Scanner.

Please choose a person to relate this publication to

Manuel Gonçalves

Marcio Gonçalves

Antonio Carlos Gonçalves

Marcelo Gonçalves

Marta Gonçalves

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
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APA
Chicago
DIN 1505
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On-Detector Electronics of the Clear PEM Scanner.