( en | de | ru )

 

Disambiguation of "Pons, Patrick"

Author of the publication

copydeleteadd this publication to your clipboard
Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches.

, , , , , , , and . Microelectron. Reliab., 48 (8-9): 1232-1236 (2008)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Mario Pons

Viviane Pons

Rouven Pons

Friedrich Robert Pons

Franz Ponsch

 

Other publications of authors with the same name

Toward Improvements in Pressure Measurements for Near Free-Field Blast Experiments., , , , , , , , , and 1 other author(s). Sensors, 23 (12): 5635 (2023)Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques., , , , , , and . Microelectron. Reliab., 50 (9-11): 1615-1620 (2010)Methods to improve reliability of bulge test technique to extract mechanical properties of thin films., , , , and . Microelectron. Reliab., 50 (9-11): 1888-1893 (2010)On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies., , , , , and . Microelectron. Reliab., 51 (9-11): 1810-1818 (2011)Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation., , , , , , , , and . Microelectron. Reliab., 48 (8-9): 1248-1252 (2008)Wireless pressure measurement in air blast using PVDF sensors., , , , , , , and . IEEE SENSORS, page 1-3. IEEE, (2016)Effect of the membrane flatness defect on the offset voltage of a silicon piezoresistive pressure sensor., , and . ICECS, page 902-905. IEEE, (2003)Biaxial initial stress characterization of bilayer gold RF-switches., , , , , , , , , and . Microelectron. Reliab., 45 (9-11): 1776-1781 (2005)Charging-Effects in RF capacitive switches influence of insulating layers composition., , , , , , and . Microelectron. Reliab., 46 (9-11): 1700-1704 (2006)Application of MEMS behavioral simulation to Physics of Failure (PoF) modeling., , , , , , , , , and . Microelectron. Reliab., 43 (9-11): 1957-1962 (2003)