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Handling wrong mapping: A new direction towards better diagnosis with low pin convolution compressors., , и . ITC, стр. 1-7. IEEE, (2016)New scan compression approach to reduce the test data volume., , и . IET Comput. Digit. Tech., 15 (4): 251-262 (2021)Cost-Driven Ranking of Memory Elements for Partial Intrusion., и . IEEE Des. Test Comput., 14 (3): 45-50 (1997)The Mutating Metric for Benchmarking Test., , и . IEEE Des. Test Comput., 17 (3): 18-21 (2000)Tough Challenges as Design and Test Go Nanometer - Guest Editors' Introduction., и . Computer, 32 (11): 42-45 (1999)Diagnosing multiple faulty chains with low pin convolution compressor using compressed production test set., , , и . ITC, стр. 1-7. IEEE, (2017)Enhancing test efficiency for delay fault testing using multiple-clocked schemes., , , , , , и . DAC, стр. 371-374. ACM, (2002)Historical Perspective on Scan Compression., , и . IEEE Des. Test Comput., 25 (2): 114-120 (2008)Enhancing security of logic encryption using embedded key generation unit., , и . ITC-Asia, стр. 131-136. IEEE, (2017)A New Logic Encryption Strategy Ensuring Key Interdependency., , , , и . VLSID, стр. 429-434. IEEE Computer Society, (2017)