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Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems.

O. Crépel, P. Poirier, P. Descamps, R. Desplats, P. Perdu, G. Haller, и A. Firiti. Microelectron. Reliab., 44 (9-11): 1559-1563 (2004)

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Maxime Crepel

Olivier Coutand

Paul Olivier

Christoph Olivier

Olivier Brede

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Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs.M. Sienkiewicz, P. Perdu, A. Firiti, K. Sanchez, O. Crépel, и D. Lewis. Microelectron. Reliab., 48 (8-9): 1529-1532 (2008)Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems.O. Crépel, P. Poirier, P. Descamps, R. Desplats, P. Perdu, G. Haller, и A. Firiti. Microelectron. Reliab., 44 (9-11): 1559-1563 (2004)Backside Hot Spot Detection Using Liquid Crystal Microscopy.O. Crépel, F. Beaudoin, L. de Morais, G. Haller, C. Goupil, P. Perdu, R. Desplats, и D. Lewis. Microelectron. Reliab., 42 (9-11): 1741-1746 (2002)Test methodology of a new upset mechanism induced by protons in deep sub-micron devices.C. Weulersse, F. Miller, D. Alexandrescu, E. Schaefer, O. Crépel, и R. Gaillard. Microelectron. Reliab., 52 (9-10): 2482-2486 (2012)Magnetic emission mapping for passive integrated components characterisation.O. Crépel, R. Desplats, Y. Bouttement, P. Perdu, C. Goupil, P. Descamps, F. Beaudoin, и L. Marina. Microelectron. Reliab., 43 (9-11): 1809-1814 (2003)Magnetic field measurements for Non Destructive Failure Analysis.O. Crépel, C. Goupil, B. Domengès, P. Descamps, P. Perdu, и A. Doukkali. Microelectron. Reliab., 42 (9-11): 1763-1766 (2002)Radiation robustness of normally-off GaN/HEMT power transistors (COTS).M. Zerarka, и O. Crépel. Microelectron. Reliab., (2018)Investigation of the Impact of Neutron Irradiation on SiC Power MOSFETs lifetime by Reliability Tests.F. Principato, G. Allegra, C. Cappello, O. Crépel, N. Nicosia, S. D'Arrigo, V. Cantarella, A. Mauro, L. Abbene, M. Mirabello и 1 other автор(ы). Sensors, 21 (16): 5627 (2021)Using the EM simulation tools to predict the Conducted Emissions level of a DC/DC boost converter: Introducing EBEM-CE model.A. Durier, C. Marot, и O. Crépel. EMC Compo, стр. 152-157. IEEE, (2013)

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