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Disambiguation of "Lombardo, Salvatore"

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Dependence of Post-Breakdown Conduction on Gate Oxide Thickness.

, , and . Microelectron. Reliab., 42 (9-11): 1481-1484 (2002)

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Salvatore Massimo Lombardo

Simone Lombardo

Salvatore Loiero

Fundamentalmetanoia: Untersuchungen zu einem Ort eschato-praktischer Erfahrungs- und Erinnerungskultur. Uni Tübingen, habilitation, (2009)

Salvatore Saputo

Salvatore Cusenza

 

Other publications of authors with the same name

Reliability of ultra-thin oxides in CMOS circuits., , , and . Microelectron. Reliab., 43 (9-11): 1353-1360 (2003)A novel approach to characterization of progressive breakdown in high-k/metal gate stacks., , , , , , , , and . Microelectron. Reliab., 48 (11-12): 1759-1764 (2008)Performance increase of tandem amorphous/microcrystalline Si PV devices under variable illumination and temperature conditions., , , , , and . Microelectron. Reliab., (2018)Designing a Public Smart Registry for an Innovative and Transparent Governance of European Ground Infrastructures., , and . IDT/IIMSS/STET, volume 262 of Frontiers in Artificial Intelligence and Applications, page 758-767. IOS Press, (2014)VIRGO: An Innovative Virtual Registry of Underground Infrastructure on Cloud., , and . EMTC, page 1-6. IEEE, (2014)Analysis of the effect of the gate oxide breakdown on SRAM stability., , , , , , , , , and . Microelectron. Reliab., 42 (9-11): 1445-1448 (2002)Study of nanocrystal memory integration in a Flash-like NOR device., , , , , , , and . Microelectron. Reliab., 47 (4-5): 593-597 (2007)Defects induced anomalous breakdown kinetics in Pr2O3 by micro- and nano-characterization., , , , , , and . Microelectron. Reliab., 47 (4-5): 640-644 (2007)Improvement of the P/E window in nanocrystal memories by the use of high-k materials in the control dielectric., , , , and . Microelectron. Reliab., 45 (5-6): 895-898 (2005)General features of progressive breakdown in gate oxides: A compact model., , and . IRPS, page 5. IEEE, (2015)