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Другие публикации лиц с тем же именем

PASCAL: Timing SCA Resistant Design and Verification Flow., , , и . IOLTS, стр. 239-242. IEEE, (2019)BASTION: Board and SoC test instrumentation for ageing and no failure found., , , , , , , , и . DATE, стр. 115-120. IEEE, (2017)Diagnostic Test Generation for Statistical Bug Localization Using Evolutionary Computation., , , , , , и . EvoApplications, том 8602 из Lecture Notes in Computer Science, стр. 425-436. Springer, (2014)Implementation-Independent Functional Test for Transition Delay Faults in Microprocessors., , , и . DSD, стр. 646-650. IEEE, (2020)Implementation-Independent Test Generation for a Large Class of Faults in RISC Processor Modules., , , и . DSD, стр. 557-561. IEEE, (2021)Fast identification of true critical paths in sequential circuits., , , , и . Microelectron. Reliab., (2018)Timing-critical path analysis with structurally synthesized BDDs., , , , , и . MECO, стр. 1-6. IEEE, (2018)On BTI Aging Rejuvenation in Memory Address Decoders., , , , , и . LATS, стр. 1-6. IEEE, (2022)Hierarchical Analysis of Short Defects between Metal Lines in CMOS IC., , , , , и . DSD, стр. 729-734. IEEE Computer Society, (2008)Identifying NBTI-Critical Paths in Nanoscale Logic., , , , , и . DSD, стр. 136-141. IEEE Computer Society, (2013)