( en | de | ru )

 

Disambiguation of "Reorda, Matteo Sonza"

Author of the publication

copydeleteadd this publication to your clipboard
On the Functional Test of the Register Forwarding and Pipeline Interlocking Unit in Pipelined Processors.

, , , , , , , and . MTV, page 52-57. IEEE Computer Society, (2013)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Matteo Garavoglia

Marco Matteo

Matteo Rini

Matteo Bertini

Matteo Gabba

 

Other publications of authors with the same name

GATTO: a genetic algorithm for automatic test pattern generation for large synchronous sequential circuits., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 15 (8): 991-1000 (1996)Evaluating Different Solutions to Design Fault Tolerant Systems with SRAM-based FPGAs., , , , and . J. Electron. Test., 23 (1): 47-54 (2007)Microprocessor Testing: Functional Meets Structural Test., , , , , and . J. Circuits Syst. Comput., 26 (8): 1740007:1-1740007:18 (2017)A Functional Approach for Testing the Reorder Buffer Memory., , , and . J. Electron. Test., 30 (4): 469-481 (2014)Software-Based Testing for System Peripherals., , , , , and . J. Electron. Test., 28 (2): 189-200 (2012)A Low-Cost Reliability vs. Cost Trade-Off Methodology to Selectively Harden Logic Circuits., , , , , and . J. Electron. Test., 33 (1): 25-36 (2017)The Use of Model Checking in ATPG for Sequential Circuits., , , and . CAV, volume 531 of Lecture Notes in Computer Science, page 86-95. Springer, (1990)Fault Grading Techniques of Software Test Libraries for Safety-Critical Applications., , and . IEEE Access, (2019)Software-Based Self-Test for Transition Faults: a Case Study., , , and . VLSI-SoC, page 76-81. IEEE, (2019)BASTION: Board and SoC test instrumentation for ageing and no failure found., , , , , , , , and . DATE, page 115-120. IEEE, (2017)