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Self-Heating in iN8-iN2 CMOS Logic Cells: Thermal Impact of Architecture (FinFET, Nanosheet, Forksheet and CFET) and Scaling Boosters.

B. Vermeersch, E. Bury, Y. Xiang, P. Schuddinck, K. Bhuwalka, G. Hellings, and J. Ryckaert. VLSI Technology and Circuits, page 371-372. IEEE, (2022)

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Kurt Bury

Dagmar Bury

Carsten Bury

Ernst Bury

Yvonne Bury

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A Physically Unclonable Function with 0% BER Using Soft Oxide Breakdown in 40nm CMOS.K. Chuang, E. Bury, R. Degraeve, B. Kaczer, D. Linten, and I. Verbauwhede. A-SSCC, page 157-160. IEEE, (2018)Characterization of time-dependent variability using 32k transistor arrays in an advanced HK/MG technology.P. Weckx, B. Kaczer, C. Chen, J. Franco, E. Bury, K. Chanda, J. Watt, P. Roussel, F. Catthoor, and G. Groeseneken. IRPS, page 3. IEEE, (2015)The properties, effect and extraction of localized defect profiles from degraded FET characteristics.M. Vandemaele, B. Kaczer, S. Tyaginov, J. Franco, R. Degraeve, A. Chasin, Z. Wu, E. Bury, Y. Xiang, H. Mertens and 1 other author(s). IRPS, page 1-7. IEEE, (2021)A BSIM-Based Predictive Hot-Carrier Aging Compact Model.Y. Xiang, S. Tyaginov, M. Vandemaele, Z. Wu, J. Franco, E. Bury, B. Truijen, B. Parvais, D. Linten, and B. Kaczer. IRPS, page 1-9. IEEE, (2021)The defect-centric perspective of device and circuit reliability - From individual defects to circuits.B. Kaczer, J. Franco, P. Weckx, P. Roussel, E. Bury, M. Cho, R. Degraeve, D. Linten, G. Groeseneken, H. Kukner and 5 other author(s). ESSDERC, page 218-225. IEEE, (2015)A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability.B. Kaczer, J. Franco, P. Weckx, P. Roussel, V. Putcha, E. Bury, M. Simicic, A. Chasin, D. Linten, B. Parvais and 4 other author(s). Microelectron. Reliab., (2018)Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations: Invited Paper.M. Vandemaele, B. Kaczer, E. Bury, J. Franco, A. Chasin, A. Makarov, H. Mertens, G. Hellings, and G. Groeseneken. IRPS, page 1-10. IEEE, (2023)Improving the Tamper-Aware Odometer Concept by Enhancing Dynamic Stress Operation.J. Diaz-Fortuny, D. Sangani, P. Saraza-Canflanca, E. Bury, R. Degraeve, and B. Kaczer. IRPS, page 1-9. IEEE, (2023)Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs.M. Vandemaele, B. Kaczer, S. Tyaginov, E. Bury, A. Chasin, J. Franco, A. Makarov, H. Mertens, G. Hellings, and G. Groeseneken. IRPS, page 6. IEEE, (2022)Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors.A. Grill, V. John, J. Michl, A. Beckers, E. Bury, S. Tyaginov, B. Parvais, A. Chasin, T. Grasser, M. Waltl and 2 other author(s). IRPS, page 10. IEEE, (2022)

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Disambiguation of "Bury, Erik"

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Self-Heating in iN8-iN2 CMOS Logic Cells: Thermal Impact of Architecture (FinFET, Nanosheet, Forksheet and CFET) and Scaling Boosters.

Please choose a person to relate this publication to

Kurt Bury

Dagmar Bury

Carsten Bury

Ernst Bury

Yvonne Bury

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Bury, Erik"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Self-Heating in iN8-iN2 CMOS Logic Cells: Thermal Impact of Architecture (FinFET, Nanosheet, Forksheet and CFET) and Scaling Boosters.

Please choose a person to relate this publication to

Kurt Bury

Dagmar Bury

Carsten Bury

Ernst Bury

Yvonne Bury

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
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history of this post
URL
DOI
BibTeX
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APA
Chicago
DIN 1505
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Self-Heating in iN8-iN2 CMOS Logic Cells: Thermal Impact of Architecture (FinFET, Nanosheet, Forksheet and CFET) and Scaling Boosters.