BibSonomy ::  author :: Gronthoud ::

bookmarks

publications

• Modeling Power Supply Noise in Delay Testing.
  Jing Wang and Duncan M. Hank Walker and Xiang Lu and Ananta K. Majhi and Bram Kruseman and Guido Gronthoud and Luis Elvira Villagra and Paul J. A. M. van de Wiel and Stefan Eichenberger IEEE Design & Test of Computers24(3):226-234(2007)
  to dblp by dblp on Nov 25, 2009, 12:00 AM
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• Memory Testing Under Different Stress Conditions: An Industrial Evaluation
  Ananta K. Majhi and Mohamed Azimane and Guido Gronthoud and Maurice Lousberg and Stefan Eichenberger and Fred Bowen CoRR(2007) informal publication .
  to dblp by dblp on Jan 2, 2008, 12:00 AM
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• Multi-VDD Testing for Analog Circuits.
  José Pineda de Gyvez and Guido Gronthoud and Rashid Amine J. Electronic Testing21(3):311-322(2005)
  to dblp by dblp on Sep 18, 2007, 12:00 AM
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• Structural Fault Modeling and Fault Detection Through Neyman-Pearson Decision Criteria for Analog Integrated Circuits.
  Amir Zjajo and José Pineda de Gyvez and Guido Gronthoud J. Electronic Testing22(4-6):399-409(2006)
  to dblp by dblp on Sep 18, 2007, 12:00 AM
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• Re-configuration of sub-blocks for effective application of time domain tests.
  Jens Anders and Shaji Krishnan and Guido Gronthoud DATE, page 707-712. ACM, (2007)
  to dblp by dblp on Jun 22, 2007, 12:00 AM
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• On Performance Testing with Path Delay Patterns.
  Bram Kruseman and Ananta K. Majhi and Guido Gronthoud VTS, page 29-34. IEEE Computer Society, (2007)
  to dblp by dblp on Jun 4, 2007, 12:00 AM
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• On Hazard-free Patterns for Fine-delay Fault Testing.
  Bram Kruseman and Ananta K. Majhi and Guido Gronthoud and Stefan Eichenberger ITC, page 213-222. IEEE, (2004)
  to dblp by dblp on Sep 21, 2006, 12:00 AM
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• Power Supply Ramping for Quasi-static Testing of PLLs.
  José Pineda de Gyvez and Guido Gronthoud and Cristiano Cenci and Martin Posch and Thomas Burger and Manfred Koller ITC, page 980-987. IEEE, (2004)
  to dblp by dblp on Sep 21, 2006, 12:00 AM
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• A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis.
  Xinyue Fan and Will Moore and Camelia Hora and Mario H. Konijnenburg and Guido Gronthoud VTS, page 266-271. IEEE Computer Society, (2006)
  to dblp by dblp on Aug 21, 2006, 12:00 AM
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• A New Algorithm for Dynamic Faults Detection in RAMs.
  Mohamed Azimane and Ananta K. Majhi and Guido Gronthoud and Maurice Lousberg VTS, page 177-182. IEEE Computer Society, (2005)
  to dblp by dblp on Jan 23, 2006, 12:00 AM
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• Memory Testing Under Different Stress Conditions: An Industrial Evaluation.
  Ananta K. Majhi and Mohamed Azimane and Guido Gronthoud and Maurice Lousberg and Stefan Eichenberger and Fred Bowen DATE, page 438-443. IEEE Computer Society, (2005)
  to dblp by dblp on Apr 13, 2005, 12:00 AM
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• Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model.
  Ananta K. Majhi and Guido Gronthoud and Camelia Hora and Maurice Lousberg and Pop Valer and Stefan Eichenberger VTS, page 345-350. IEEE Computer Society, (2003)
  to dblp by dblp on Jul 6, 2004, 12:00 AM
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• VDD Ramp Testing for RF Circuits.
  José Pineda de Gyvez and Guido Gronthoud and Rashid Amine ITC, page 651-658. IEEE Computer Society, (2003)
  to dblp by dblp on Feb 25, 2004, 12:00 AM
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• Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything?
  Moore and Guido Gronthoud and Keith Baker and Maurice Lousberg ITC, page 95-104. IEEE Computer Society, (2000)
  to dblp by dblp on Nov 20, 2002, 12:00 AM
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