( en | de | ru )

 

Disambiguation of "Hamada, Shuji"

Author of the publication

copydeleteadd this publication to your clipboard
Recognition of Sensitized Longest Paths in Transition Delay Test.

, , , , and . ITC, page 1-6. IEEE Computer Society, (2006)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Shuji Kimura

Shuji Sato

Sandra Hamada

Taha Auf Hamada

Mahmoud Ahmed Hamada

 

Other publications of authors with the same name

Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects., , , , , , , , , and . ATS, page 139-146. IEEE, (2006)Invisible delay quality - SDQM model lights up what could not be seen., , , , , and . ITC, page 9. IEEE Computer Society, (2005)A Statistical Quality Model for Delay Testing., , , , and . IEICE Trans. Electron., 89-C (3): 349-355 (2006)Path delay test compaction with process variation tolerance., , , , , and . DAC, page 845-850. ACM, (2005)Not all Delay Tests Are the Same - SDQL Model Shows True-Time., , , , , and . ATS, page 147-152. IEEE, (2006)Recognition of Sensitized Longest Paths in Transition Delay Test., , , , and . ITC, page 1-6. IEEE Computer Society, (2006)A Framework of High-quality Transition Fault ATPG for Scan Circuits., , , , , , and . ITC, page 1-6. IEEE Computer Society, (2006)A dynamic test compaction procedure for high-quality path delay testing., , , , , and . ASP-DAC, page 348-353. IEEE, (2006)Evaluation of the statistical delay quality model., , , , and . ASP-DAC, page 305-310. ACM Press, (2005)Method of diagnosing multiple stuck-at-faults in combinational circuits., , , , and . Syst. Comput. Jpn., 22 (11): 21-30 (1991)