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Ultrathin wafer handling in 3D Stacked IC manufacturing combining a novel ZoneBOND™ temporary bonding process with room temperature peel debonding.

, , , , , , , , , , , , , , , and . 3DIC, page 1-4. IEEE, (2011)

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Protective Layer for Collective Die to Wafer Hybrid Bonding., , , , , , , and . 3DIC, page 1-4. IEEE, (2019)300mm wafer thinning and backside passivation compatibility with temporary wafer bonding for 3D stacked IC applications., , , , , , , , , and . 3DIC, page 1-4. IEEE, (2010)In-line metrology and inspection for process control during 3D stacking of IC's., , , , , , , and . 3DIC, page 1-4. IEEE, (2011)Ultrathin wafer handling in 3D Stacked IC manufacturing combining a novel ZoneBOND™ temporary bonding process with room temperature peel debonding., , , , , , , , , and 6 other author(s). 3DIC, page 1-4. IEEE, (2011)Design issues and considerations for low-cost 3D TSV IC technology., , , , , , , , , and 24 other author(s). ISSCC, page 148-149. IEEE, (2010)Process Complexity and Cost Considerations of Multi-Layer Die Stacks., , , , , , , , , and 5 other author(s). 3DIC, page 1-6. IEEE, (2019)Importance of alignment control during permanent bonding and its impact on via-last alignment for high density 3D interconnects., , , , , , , , , and . 3DIC, page 1-5. IEEE, (2016)