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Disambiguation of "Grasser, Tibor"

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Modeling of NBTI Induced Threshold Voltage Shift Based on Activation Energy Maps Under Consideration of Variability.

, , , , and . IRPS, page 1-7. IEEE, (2023)

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Klaus Tiborski

Laszlo Tibor

Reinhard Gräßer

Fritz Gräßer

Renate Grasser

 

Other publications of authors with the same name

A GPU-Accelerated Parallel Preconditioner for the Solution of the Boltzmann Transport Equation for Semiconductors., , and . Facing the Multicore-Challenge, volume 7174 of Lecture Notes in Computer Science, page 147-157. Springer, (2011)An advanced equation assembly module., , , and . Eng. Comput., 21 (2): 151-163 (2005)NBTI in Si0.55Ge0.45 cladding p-FinFETs: Porting the superior reliability from planar to 3D architectures., , , , , , , , , and . IRPS, page 2. IEEE, (2015)Editorial., and . Microelectron. Reliab., 47 (6): 839-840 (2007)Impact of O-Si-O bond angle fluctuations on the Si-O bond-breakage rate., , , , and . Microelectron. Reliab., 49 (9-11): 998-1002 (2009)Interface traps density-of-states as a vital component for hot-carrier degradation modeling., , , , , , , , , and 4 other author(s). Microelectron. Reliab., 50 (9-11): 1267-1272 (2010)On the temperature and voltage dependence of short-term negative bias temperature stress., , , and . Microelectron. Reliab., 49 (9-11): 1013-1017 (2009)Comparison of analytic distribution function models for hot-carrier degradation modeling in nLDMOSFETs., , , , , , , , and . Microelectron. Reliab., 55 (9-10): 1427-1432 (2015)An analytical approach for physical modeling of hot-carrier induced degradation., , , , , , , , and . Microelectron. Reliab., 51 (9-11): 1525-1529 (2011)A review of hydrodynamic and energy-transport models for semiconductor device simulation., , , and . Proc. IEEE, 91 (2): 251-274 (2003)