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An advanced equation assembly module., , , и . Eng. Comput., 21 (2): 151-163 (2005)A GPU-Accelerated Parallel Preconditioner for the Solution of the Boltzmann Transport Equation for Semiconductors., , и . Facing the Multicore-Challenge, том 7174 из Lecture Notes in Computer Science, стр. 147-157. Springer, (2011)Editorial., и . Microelectron. Reliab., 47 (6): 839-840 (2007)Impact of O-Si-O bond angle fluctuations on the Si-O bond-breakage rate., , , , и . Microelectron. Reliab., 49 (9-11): 998-1002 (2009)Interface traps density-of-states as a vital component for hot-carrier degradation modeling., , , , , , , , , и 4 other автор(ы). Microelectron. Reliab., 50 (9-11): 1267-1272 (2010)On the temperature and voltage dependence of short-term negative bias temperature stress., , , и . Microelectron. Reliab., 49 (9-11): 1013-1017 (2009)NBTI in Si0.55Ge0.45 cladding p-FinFETs: Porting the superior reliability from planar to 3D architectures., , , , , , , , , и . IRPS, стр. 2. IEEE, (2015)Optical Emission Correlated to Bias Temperature Instability in SiC MOSFETs., , , , , и . IRPS, стр. 3. IEEE, (2022)Comparison of analytic distribution function models for hot-carrier degradation modeling in nLDMOSFETs., , , , , , , , и . Microelectron. Reliab., 55 (9-10): 1427-1432 (2015)An analytical approach for physical modeling of hot-carrier induced degradation., , , , , , , , и . Microelectron. Reliab., 51 (9-11): 1525-1529 (2011)