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Disambiguation of "Mitard, Jérôme"

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Towards high performance sub-10nm finW bulk FinFET technology.

, , , , , , , , , , , , , , , , , , , and . ESSDERC, page 131-134. IEEE, (2016)

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Jérôme Huppertz

Modulation inflammatorischer Prozesse mittels GPI-verankerter Chemokin-Analoga. Uni München, (2009)

Jérôme Clerc

Jérôme Boucher

Jérôme Krets

Jérôme Feret

 

Other publications of authors with the same name

CDM-Time Domain Turn-on Transient of ESD Diodes in Bulk FinFET and GAA NW Technologies., , , , , , , , , and . IRPS, page 1-7. IEEE, (2019)Detecting Transistor Defects in Medical Systems Using a Multi Model Ensemble of Convolutional Neural Networks., , , and . IEEE BigData, page 4731-4737. IEEE, (2021)Scaling CMOS beyond Si FinFET: an analog/RF perspective., , , , , , , , , and 4 other author(s). ESSDERC, page 158-161. IEEE, (2018)Low-power DRAM-compatible Replacement Gate High-k/Metal Gate stacks., , , , , , , , , and 2 other author(s). ESSDERC, page 242-245. IEEE, (2012)Initial and PBTI-induced traps and charges in Hf-based oxides/TiN stacks., , , , , and . Microelectron. Reliab., 47 (4-5): 489-496 (2007)Automatic Prediction of Metal-Oxide-Semiconductor Field-Effect Transistor Threshold Voltage Using Machine Learning Algorithm., , , , , , , , , and 1 other author(s). Adv. Intell. Syst., (January 2023)Reliability and Variability-Aware DTCO Flow: Demonstration of Projections to N3 FinFET and Nanosheet Technologies., , , , , , , , , and 10 other author(s). IRPS, page 1-6. IEEE, (2021)Enhanced data integrity of In-Ga-Zn-Oxide based Capacitor-less 2T memory for DRAM applications., , , , , , , , , and . ESSDERC, page 275-278. IEEE, (2021)Low-frequency noise assessment of the transport mechanisms in SiGe channel bulk FinFETs., , , , , , , , , and 1 other author(s). ESSDERC, page 330-333. IEEE, (2012)Isolation of nanowires made on bulk wafers by ground plane doping., , , , , and . ESSDERC, page 300-303. IEEE, (2017)