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Disambiguation of "Guitard, Nicolas"

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TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology.

, , , , , , and . Microelectron. Reliab., 43 (1): 71-79 (2003)

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Nicolas Jeanvoine

Plasma-material interaction and electrode degradation in high voltage ignition discharges. Uni Saarbrücken, (2009)

Nicolas Viveros

Nicolas Straus

Nicolas Hunzelmann

Nicolas Schönfeld

 

Other publications of authors with the same name

Study of the ESD defects impact on ICs reliability., , , , , , , , and . Microelectron. Reliab., 44 (9-11): 1811-1815 (2004)Symmetrical ESD trigger and pull-up using BIMOS transistor in advanced CMOS technology., , , , , , , and . Microelectron. Reliab., 52 (9-10): 1998-2004 (2012)Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure., , , , , , , , and . Microelectron. Reliab., 45 (9-11): 1415-1420 (2005)TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology., , , , , , and . Microelectron. Reliab., 43 (1): 71-79 (2003)Smart Way to Adjust Schottky Barrier Height in 130 nm BiCMOS Process for sub-THz Applications., , , , , , , and . RWS, page 337-340. IEEE, (2020)Simulation, characterization and implementation of a new SCR-based device with a turn-off capability for EOS-immune ESD power supply clamps in advanced CMOS technology nodes., , , , , and . Microelectron. Reliab., (2018)Recovery of Intrinsic Heterojunction Bipolar Transistors Profiles by Neural Networks., , , and . BCICTS, page 228-231. IEEE, (2022)BIMOS transistor and its applications in ESD protection in advanced CMOS technology., , , , , , , , and . ICICDT, page 1-4. IEEE, (2012)Application of various optical techniques for ESD defect localization., , , , , , , , , and . Microelectron. Reliab., 46 (9-11): 1563-1568 (2006)Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications., , , , , , , , and . Microelectron. Reliab., 44 (9-11): 1781-1786 (2004)