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Test point insertion in hybrid test compression/LBIST architectures.

E. Moghaddam, N. Mukherjee, J. Rajski, J. Tyszer, and J. Zawada. ITC, page 1-10. IEEE, (2016)

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Percilla Moghaddam

Elham Farvili

Elham Rostamian

Elham Farazdaghi

Huschang Elhami

Other publications of authors with the same name

Minimal area test points for deterministic patterns.Y. Liu, E. Moghaddam, N. Mukherjee, S. Reddy, J. Rajski, and J. Tyszer. ITC, page 1-7. IEEE, (2016)At-speed scan test with low switching activity.E. Moghaddam, J. Rajski, S. Reddy, and M. Kassab. VTS, page 177-182. IEEE Computer Society, (2010)An On-Line BIST Technique for Delay Fault Detection in CMOS Circuits.E. Moghaddam, and S. Hessabi. ATS, page 73-78. IEEE, (2007)On New Test Points for Compact Cell-Aware Tests.C. Acero, D. Feltham, M. Patyra, F. Hapke, E. Moghaddam, N. Mukherjee, V. Neerkundar, J. Rajski, J. Tyszer, and J. Zawada. IEEE Des. Test, 33 (6): 7-14 (2016)Low capture power at-speed test in EDT environment.E. Moghaddam, J. Rajski, S. Reddy, X. Lin, N. Mukherjee, and M. Kassab. ITC, page 714-723. IEEE Computer Society, (2010)Isometric Test Data Compression.A. Kumar, M. Kassab, E. Moghaddam, N. Mukherjee, J. Rajski, S. Reddy, J. Tyszer, and C. Wang. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 34 (11): 1847-1859 (2015)Design for low test pattern counts.H. Konuk, E. Moghaddam, N. Mukherjee, J. Rajski, D. Solanki, J. Tyszer, and J. Zawada. DAC, page 136:1-136:6. ACM, (2015)An On-Line BIST Technique for Stuck-Open Fault Detection in CMOS Circuits.E. Moghaddam, and S. Hessabi. DSD, page 619-625. IEEE Computer Society, (2007)Test Time and Area Optimized BrST Scheme for Automotive ICs.N. Mukherjee, J. Tyszer, D. Tille, M. Sapati, Y. Liu, J. Mayer, S. Milewski, E. Moghaddam, J. Rajski, and J. Solecki. ITC, page 1-10. IEEE, (2019)Embedded Deterministic Test Points.C. Acero, D. Feltham, Y. Liu, E. Moghaddam, N. Mukherjee, M. Patyra, J. Rajski, S. Reddy, J. Tyszer, and J. Zawada. IEEE Trans. Very Large Scale Integr. Syst., 25 (10): 2949-2961 (2017)

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Disambiguation of "Moghaddam, Elham K."

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Test point insertion in hybrid test compression/LBIST architectures.

Please choose a person to relate this publication to

Percilla Moghaddam

Elham Farvili

Elham Rostamian

Elham Farazdaghi

Huschang Elhami

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Moghaddam, Elham K."

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Test point insertion in hybrid test compression/LBIST architectures.

Please choose a person to relate this publication to

Percilla Moghaddam

Elham Farvili

Elham Rostamian

Elham Farazdaghi

Huschang Elhami

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Test point insertion in hybrid test compression/LBIST architectures.