( en | de | ru )

 

Disambiguation of "Wen, Xiaoqing"

Author of the publication

copydeleteadd this publication to your clipboard
At-Speed Logic BIST for IP Cores.

, , , , , , , , and . DATE, page 860-861. IEEE Computer Society, (2005)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Xiaoqing Pan

Xiaoqing Liu

Xiaoqing Li

Xiaoqing Shen

Xiaoqing Jin

 

Other publications of authors with the same name

Novel Double-Node-Upset-Tolerant Memory Cell Designs Through Radiation-Hardening-by-Design and Layout., , , , and . IEEE Trans. Reliability, 68 (1): 354-363 (2019)A Flexible Scan-in Power Control Method in Logic BIST and Its Evaluation with TEG Chips., , , , and . IEEE Trans. Emerg. Top. Comput., 8 (3): 591-601 (2020)A dynamic test compaction procedure for high-quality path delay testing., , , , , and . ASP-DAC, page 348-353. IEEE, (2006)On estimation of NBTI-Induced delay degradation., , , , , and . European Test Symposium, page 107-111. IEEE Computer Society, (2010)A Static Method for Analyzing Hotspot Distribution on the LSI., , , , and . ITC-Asia, page 73-78. IEEE, (2019)A Cost-Effective TSV Repair Architecture for Clustered Faults in 3-D IC., , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 40 (9): 1952-1956 (2021)Novel Speed-and-Power-Optimized SRAM Cell Designs With Enhanced Self-Recoverability From Single- and Double-Node Upsets., , , , , , , and . IEEE Trans. Circuits Syst., 67-I (12): 4684-4695 (2020)A Study of Capture-Safe Test Generation Flow for At-Speed Testing., , , , , , , , , and 1 other author(s). IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 93-A (7): 1309-1318 (2010)A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing., , , , , , and . IEICE Trans. Inf. Syst., 96-D (9): 2003-2011 (2013)A Novel ATPG Method for Capture Power Reduction during Scan Testing., , , , , , and . IEICE Trans. Inf. Syst., 90-D (9): 1398-1405 (2007)