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Using Launch-on-Capture for Testing BIST Designs Containing Synchronous and Asynchronous Clock Domains.

L. Wang, X. Wen, S. Wu, H. Furukawa, H. Chao, B. Sheu, J. Guo, и W. Jone. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 29 (2): 299-312 (2010)

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Sheu-Sheu Tan

Ming-Shye Sheu

Huey-jen Sheu

Ching-Long Sheu

Sien-Yi Sheu

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