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Bias Temperature Instability analysis of FinFET based SRAM cells., , , , , , и . DATE, стр. 1-6. European Design and Automation Association, (2014)Resolving the memory bottleneck for single supply near-threshold computing., , , , , и . DATE, стр. 1-6. European Design and Automation Association, (2014)Dimensioning for power and performance under 10nm: The limits of FinFETs scaling., , , , , , , и . ICICDT, стр. 1-4. IEEE, (2015)Modeling FinFET metal gate stack resistance for 14nm node and beyond., , , , , , , , и . ICICDT, стр. 1-4. IEEE, (2015)A Customized Cross-Bar for Data-Shuffling in Domain-Specific SIMD Processors., , , , , , и . ARCS, том 4415 из Lecture Notes in Computer Science, стр. 57-68. Springer, (2007)Exploratory Power Noise Models of Standard Cell 14, 10, and 7 nm FinFET ICs., , , и . ACM Great Lakes Symposium on VLSI, стр. 233-238. ACM, (2016)Comparison of NBTI aging on adder architectures and ring oscillators in the downscaling technology nodes., , , , , , , , , и 5 other автор(ы). Microprocess. Microsystems, 39 (8): 1039-1051 (2015)Design of a Low Power Pre-synchronization ASIP for Multimode SDR Terminals., , , , , , и . SAMOS, том 4599 из Lecture Notes in Computer Science, стр. 322-332. Springer, (2007)System Level Comparison of 3D Integration Technologies for Future Mobile MPSoC Platform., , , , , , и . IEEE Embed. Syst. Lett., 6 (4): 85-88 (2014)A Scalable MIMO Detector Processor With Near-ASIC Energy Efficiency., , , и . IEEE Trans. Very Large Scale Integr. Syst., 23 (10): 1973-1986 (2015)